Olympus X-5000 Mobile XRF Analyzer

Product Specifications
BRAND  Olympus
MODEL  X-5000
BRAND Olympus
TYPE Tabletop
APPLICATION Alloys in Soil
APPLICATION Positive Material Identification
APPLICATION Product Testing
DESCRIPTION
The Olympus X-5000 Mobile XRF analyzer is a high-powered instrument with a secured closed beam sample chamber. It is a portable device with easy-to-use performance, and has immediate action in the field, on production lines, and in inspection areas.
ADDITIONAL INFORMATION
  • Features include ergonomic design, integrated PC, industrialized touch screen, user-friendly operation, handles assorted objects, fully interlocked and closed-beam X-ray system, large-area silicon drift detector (SSD), high precision measurement of a wide array of elements, six-position primary beam filters and an outstanding performance for light elements without vacuum or helium purge.
  • On-board PC offers a full operation with a large display, virtual keyboard, color touch screen, spectral overlay, and easy peak identification. Suitable for elemental analysis in petrochemical fluids or hydrocarbons, mining, geochemistry, environmental analysis, alloy analysis, consumer products, and RoHS directives. Elements detectable to a concentration of 100% are aluminum, antimony, barium, copper, calcium, chlorine, cadmium, chromium, iron, molybdenum, manganese, nickel, potassium, phosphorous, silicon, sulfur, silver, titanium, tin, vanadium, and zinc. Multiple analysis modes include fundamental parameters, Compton normalization, empirical calibration models and spectral matching. Specifications include a 10 W X-ray tube, the resolution is less than 165 eV, 20.9 x 15.9 cm field hardened color touch screen, 10 to 220 V AC power adapter and operating temperature ranging from 10 to 50 degrees C.
SPECIFICATION OVERVIEW:
  • Ergonomic design
  • Integrated PC
  • Industrialized touch screen
  • User-friendly operation
  • Handles assorted objects
  • Fully interlocked and closed-beam X-ray system
  • Large-area silicon drift detector (SSD)
  • High precision measurement of a wide array of elements
  • Six-position primary beam filters

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